Abstract: Degradation analysis is a crucial issue for the improvement of sensor laser diodes. Degradation occurs
in three different modes: rapid, gradual and catastrophic. It can be located inside the cavity or at the facet
mirrors. Each type of degradation presents its own signature and different crystal defects appear associated
with them. The main physical mechanisms responsible for laser degradation are analyzed showing
the relation between the main degradation modes and the different materials properties
of the laser structures.

Keywords: Lifetime, Laser Sensor, Reliability, Laser Diodes

References & Academic research:

[1] Fukuda, Reliability and Degradation of Semiconductor Lasers and LEDs, MA, Norwood:Artech House, 1991.

[2] A 1.3-µm GaInNAs Laser Diode with a Lifetime of over 1000 Hour Masahiko Kondow1, Takeshi Kitatani 1,Tanaka 3 1999 The Japan Society of Applied Physics.

[3] Reliability of Semiconductor Laser Packaging in Space Applications Ivair Gontijo, Yueming Qiu, Andrew A. Shapiro
Jet Propulsion Laboratory California Institute of Technology 4800 Oak Grove Drive Pasadena, California, 91109, USA.

[4] Watzke, S.; Altieri-Weimar, P. Degradation of silicone in white LEDs during device operation: A finite element
approach to product reliability prediction. Microelectron. Reliab. 2015, 55, 733–73.

[5] Handbook of modern sensor J. Fraden Springer 4ième ed 2010.

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